Fabrication of Nano-Grating by Focused Ion Beam / Scanning Electron Microscopy Dual-Beam System

Yao, B.Y. / Luo, H. / Feng, L.S. et al. | British Library Online Contents | 2011

Fabrication of coaxial plasmonic crystals by focused ion beam milling and electron-beam lithography

Jiang, X. / Gu, Q. / Wang, F. et al. | British Library Online Contents | 2013

Characterization of TiN thin films subjected to nanoindentation using focused ion beam milling

Ma, L. W. / Cairney, J. M. / Hoffman, M. J. et al. | British Library Online Contents | 2004

Three-dimensional pore structure characterization of cement paste by X-ray computed tomography (XCT) and focused ion beam/scanning electron microscopy (FIB/SEM)

Jiang, Zhilu / Pan, Yingjie / Fu, Chuanqing et al. | Elsevier | 2023

Milling of polymeric photonic crystals by focused ion beam

Pialat, E. / Trigaud, T. / Bernical, V. et al. | British Library Online Contents | 2005