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Fabrication of Nano-Grating by Focused Ion Beam / Scanning Electron Microscopy Dual-Beam System
Fabrication of Nano-Grating by Focused Ion Beam / Scanning Electron Microscopy Dual-Beam System
Fabrication of Nano-Grating by Focused Ion Beam / Scanning Electron Microscopy Dual-Beam System
Yao, B.Y. (Autor:in) / Luo, H. (Autor:in) / Feng, L.S. (Autor:in) / Zhou, Z. (Autor:in) / Wang, R.M. (Autor:in) / Chi, Y.Y. (Autor:in)
KEY ENGINEERING MATERIALS ; 483 ; 66-69
01.01.2011
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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