Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region: Fid-Bau Portal

Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region

Jiang, Y. P. / Tang, X. G. / Liu, Q. X. / Li, Q. / Ding, A. L.

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Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region

Jiang, Y. P. / Tang, X. G. / Liu, Q. X. / Li, Q. / Ding, A. L.

Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region

Jiang, Y. P. / Tang, X. G. / Liu, Q. X. / Li, Q. / Ding, A. L.

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Titel:

Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region

Beteiligte:

Jiang, Y. P. (Autor:in) / Tang, X. G. (Autor:in) / Liu, Q. X. (Autor:in) / Li, Q. (Autor:in) / Ding, A. L. (Autor:in)

Erschienen in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 137 ; 304-309

Erscheinungsdatum:

01.01.2007

Format / Umfang:

6 pages

ISSN:

0921-5107

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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