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Optical properties of post-annealed ZnO:Al thin films studied by spectroscopic ellipsometry
Optical properties of post-annealed ZnO:Al thin films studied by spectroscopic ellipsometry
Optical properties of post-annealed ZnO:Al thin films studied by spectroscopic ellipsometry
Hwang, Y.H. (Autor:in) / Kim, H.M. (Autor:in) / Um, Y.H. (Autor:in) / Park, H.Y. (Autor:in) / Boo, J.-H. / Ahn, H.
01.01.2012
4 pages
Aufsatz (Zeitschrift)
Englisch
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