Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region: Fid-Bau Portal

Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region

Jiang, Y. P. / Tang, X. G. / Liu, Q. X. / Li, Q. / Ding, A. L.

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Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region

Jiang, Y. P. / Tang, X. G. / Liu, Q. X. / Li, Q. / Ding, A. L.

Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region

Jiang, Y. P. / Tang, X. G. / Liu, Q. X. / Li, Q. / Ding, A. L.

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Document information

Title:

Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV-vis-NIR region

Contributors:

Jiang, Y. P. (author) / Tang, X. G. (author) / Liu, Q. X. (author) / Li, Q. (author) / Ding, A. L. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 137 ; 304-309

Publication date:

2007-01-01

Size:

6 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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