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STM studies of the reconstructed Au(111) thin-film at elevated temperatures
STM studies of the reconstructed Au(111) thin-film at elevated temperatures
STM studies of the reconstructed Au(111) thin-film at elevated temperatures
Kowalczyk, P. (Autor:in) / Kozlowski, W. (Autor:in) / Klusek, Z. (Autor:in) / Olejniczak, W. (Autor:in) / Datta, P. K. (Autor:in)
APPLIED SURFACE SCIENCE ; 253 ; 4715-4720
01.01.2007
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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Thin-film SOI n-MOSFET low-frequency noise measurements at elevated temperatures
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