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Investigation of creep stress characterization of thin film/substrate systems with indentation method
Investigation of creep stress characterization of thin film/substrate systems with indentation method
Investigation of creep stress characterization of thin film/substrate systems with indentation method
Xu, B. X. (Autor:in) / Wang, X. M. (Autor:in) / Zhao, B. (Autor:in) / Yue, Z. F. (Autor:in)
MATERIALS AT HIGH TEMPERATURES ; 24 ; 67-72
01.01.2007
6 pages
Aufsatz (Zeitschrift)
Englisch
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