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    Investigation of creep stress characterization of thin film/substrate systems with indentation method

    New search for: Xu, B. X.
    New search for: Wang, X. M.
    New search for: Zhao, B.
    New search for: Yue, Z. F.

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    Investigation of creep stress characterization of thin film/substrate systems with indentation method

    New search for: Xu, B. X.
    New search for: Wang, X. M.
    New search for: Zhao, B.
    New search for: Yue, Z. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigation of creep stress characterization of thin film/substrate systems with indentation method

    New search for: Xu, B. X.
    New search for: Wang, X. M.
    New search for: Zhao, B.
    New search for: Yue, Z. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Investigation of creep stress characterization of thin film/substrate systems with indentation method

    Contributors:

    Xu, B. X. (author) / Wang, X. M. (author) / Zhao, B. (author) / Yue, Z. F. (author)

    Published in:

    MATERIALS AT HIGH TEMPERATURES ; 24 ; 67-72

    Publication date:

    2007-01-01

    Size:

    6 pages

    ISSN:

    0960-3409

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11 / 669

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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