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Effects of thermal annealing on In-induced metastable defects in InGaN films
Effects of thermal annealing on In-induced metastable defects in InGaN films
Effects of thermal annealing on In-induced metastable defects in InGaN films
Hung, H. (Autor:in) / Lam, K. T. (Autor:in) / Chang, S. J. (Autor:in) / Kuan, H. (Autor:in) / Chen, C. H. (Autor:in) / Liaw, U. H. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 10 ; 112-116
01.01.2007
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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