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Effects of thermal annealing on In-induced metastable defects in InGaN films

Hung, H. / Lam, K. T. / Chang, S. J. / Kuan, H. / Chen, C. H. / Liaw, U. H.

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Effects of thermal annealing on In-induced metastable defects in InGaN films

Hung, H. / Lam, K. T. / Chang, S. J. / Kuan, H. / Chen, C. H. / Liaw, U. H.

Effects of thermal annealing on In-induced metastable defects in InGaN films

Hung, H. / Lam, K. T. / Chang, S. J. / Kuan, H. / Chen, C. H. / Liaw, U. H.

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Check availability in my library

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Document information

Title:

Effects of thermal annealing on In-induced metastable defects in InGaN films

Contributors:

Hung, H. (author) / Lam, K. T. (author) / Chang, S. J. (author) / Kuan, H. (author) / Chen, C. H. (author) / Liaw, U. H. (author)

Published in:

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 10 ; 112-116

Publication date:

2007-01-01

Size:

5 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

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