Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Structural Analysis of Polycrystalline BiFeO~3 Films by Transmission Electron Microscopy
Structural Analysis of Polycrystalline BiFeO~3 Films by Transmission Electron Microscopy
Structural Analysis of Polycrystalline BiFeO~3 Films by Transmission Electron Microscopy
Naganuma, H. ( Autor:in ) / Kovacs, A. ( Autor:in ) / Hirata, A. ( Autor:in ) / Hirotsu, Y. ( Autor:in ) / Okamura, S. ( Autor:in )
MATERIALS TRANSACTIONS ; 48 ; 2370-2373
01.01.2007
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Infrared spectroscopy and transmission electron microscopy of polycrystalline silicon carbide
British Library Online Contents | 2001
|Twin wall distortions through structural investigation of epitaxial BiFeO~3 thin films
British Library Online Contents | 2011
|Structural investigation of Ge-Sb-Sn thin films using transmission electron microscopy
British Library Online Contents | 2006
|British Library Online Contents | 2007
|Resistive hysteresis in BiFeO"3 thin films
British Library Online Contents | 2011
|