Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Tris(dialkylamino)aluminums: Syntheses, characterization, volatility comparison and atomic layer deposition of alumina thin films
Tris(dialkylamino)aluminums: Syntheses, characterization, volatility comparison and atomic layer deposition of alumina thin films
Tris(dialkylamino)aluminums: Syntheses, characterization, volatility comparison and atomic layer deposition of alumina thin films
Wade, C. R. (Autor:in) / Silvernail, C. (Autor:in) / Banerjee, C. (Autor:in) / Soulet, A. (Autor:in) / McAndrew, J. (Autor:in) / Belot, J. A. (Autor:in)
MATERIALS LETTERS ; 61 ; 5079-5082
01.01.2007
4 pages
Aufsatz (Zeitschrift)
Englisch
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Study of Annealing Texture Components in High Purity Aluminums
British Library Online Contents | 2002
|Perovskite Thin Films via Atomic Layer Deposition
British Library Online Contents | 2015
|Atomic layer deposition of PbZrO3 thin films
British Library Online Contents | 2007
|SrCoO3-d thin films by atomic layer deposition
British Library Online Contents | 2014
|Composite model for creep behaviors of pure aluminums at a room temperature
British Library Online Contents | 1998
|