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Characterization of hydrogenated nanocrystalline silicon thin films prepared with various negative direct current biases
Characterization of hydrogenated nanocrystalline silicon thin films prepared with various negative direct current biases
Characterization of hydrogenated nanocrystalline silicon thin films prepared with various negative direct current biases
Shim, J.-H. (Autor:in) / Cho, N.-H. (Autor:in) / Lee, E.-H. (Autor:in) / Lee, H.-S. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 23 ; 790-797
01.01.2008
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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