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Experimental Investigation of Microstructure and Piezoresistive Properties of Phosphorus-Doped Hydrogenated Nanocrystalline Silicon Thin Films Prepared by PECVD
Experimental Investigation of Microstructure and Piezoresistive Properties of Phosphorus-Doped Hydrogenated Nanocrystalline Silicon Thin Films Prepared by PECVD
Experimental Investigation of Microstructure and Piezoresistive Properties of Phosphorus-Doped Hydrogenated Nanocrystalline Silicon Thin Films Prepared by PECVD
Pan, H.B. (Autor:in) / Ding, J.N. (Autor:in) / Cheng, G.G. (Autor:in) / Cao, B.G. (Autor:in)
KEY ENGINEERING MATERIALS ; 609/610 ; 208-217
01.01.2014
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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