Failure Modes and FEM Analysis of Microelectronic Packaging

Lu, G. Y. / Hu, D. Y. | British Library Online Contents | 2006

Analysis of failure mechanisms in the interconnect lines of microelectronic circuits

Bower, A. F. / Craft, D. | British Library Online Contents | 1998

Microelectronic Centre, Duisburg

Foster, N. / University College Dublin; Energy Research Group | British Library Conference Proceedings | 1996

Microelectronic-interconnection design

Branch, G.L. / Scapple, R.Y. | Engineering Index Backfile | 1962

Scanning Auger microscopy study of electromigration induced failure in submicrometric microelectronic devices

Santucci, S. / Lozzi, L. / Pacifico, D. et al. | British Library Online Contents | 1999