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    Shear Induced Low- and High-Angle Boundary Characterization Using Kikuchi Bands in Transmission Electron Microscopy

    New search for: Cabibbo, M.
    New search for: Estrin, Y.
    New search for: Maier, H.J.

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    Shear Induced Low- and High-Angle Boundary Characterization Using Kikuchi Bands in Transmission Electron Microscopy

    New search for: Cabibbo, M.
    New search for: Estrin, Y.
    New search for: Maier, H.J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Shear Induced Low- and High-Angle Boundary Characterization Using Kikuchi Bands in Transmission Electron Microscopy

    New search for: Cabibbo, M.
    New search for: Estrin, Y.
    New search for: Maier, H.J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Shear Induced Low- and High-Angle Boundary Characterization Using Kikuchi Bands in Transmission Electron Microscopy

    Contributors:

    Cabibbo, M. (author) / Estrin, Y. / Maier, H.J.

    Published in:

    Nanomaterials by Severe Plastic Deformation IV PART 1 Selected, peer reviewed papers from the 4th International Conference on Nanomaterials by Severe Plastic Deformation, Goslar, Germany, August 18-22, 2008 ; 293-299

    MATERIALS SCIENCE FORUM ; 584/586

    Publication date:

    2008-01-01

    Size:

    7 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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