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Three-Dimensional Observation of Dislocations by Electron Tomography in a Silicon Crystal
Three-Dimensional Observation of Dislocations by Electron Tomography in a Silicon Crystal
Three-Dimensional Observation of Dislocations by Electron Tomography in a Silicon Crystal
Tanaka, M. (Autor:in) / Honda, M. (Autor:in) / Mitsuhara, M. (Autor:in) / Hata, S. (Autor:in) / Kaneko, K. (Autor:in) / Higashida, K. (Autor:in)
MATERIALS TRANSACTIONS ; 49 ; 1953-1956
01.01.2008
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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