Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
High-voltage electron-microscopical observation of crack-tip dislocations in silicon crystals
High-voltage electron-microscopical observation of crack-tip dislocations in silicon crystals
High-voltage electron-microscopical observation of crack-tip dislocations in silicon crystals
Tanaka, M. (Autor:in) / Higashida, K. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A ; 400-401 ; 426-430
01.01.2005
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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