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Three-Dimensional Observation of Dislocations by Electron Tomography in a Silicon Crystal
Three-Dimensional Observation of Dislocations by Electron Tomography in a Silicon Crystal
Three-Dimensional Observation of Dislocations by Electron Tomography in a Silicon Crystal
Tanaka, M. (author) / Honda, M. (author) / Mitsuhara, M. (author) / Hata, S. (author) / Kaneko, K. (author) / Higashida, K. (author)
MATERIALS TRANSACTIONS ; 49 ; 1953-1956
2008-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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