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Effects of electromigration on the growth of intermetallic compounds in Cu/SnBi/Cu solder joints
Effects of electromigration on the growth of intermetallic compounds in Cu/SnBi/Cu solder joints
Effects of electromigration on the growth of intermetallic compounds in Cu/SnBi/Cu solder joints
Gu, X. (Autor:in) / Yang, D. (Autor:in) / Chan, Y.C. (Autor:in) / Wu, B.Y. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 23 ; 2591-2596
01.01.2008
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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