Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
High Resolution MicroRaman Study of Blisters in Cr~2O~3 Thermal Oxide Films
High Resolution MicroRaman Study of Blisters in Cr~2O~3 Thermal Oxide Films
High Resolution MicroRaman Study of Blisters in Cr~2O~3 Thermal Oxide Films
Kemdehoundja, M. (Autor:in) / Grosseau-Poussard, J.L. (Autor:in) / Dinhut, J.F. (Autor:in) / Bonnet, G. (Autor:in) / Steinmetz, P. / Wright, I.G. / Galerie, A. / Monceau, D. / Mathieu, S.
01.01.2008
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
MicroRaman study of bulk inclusions in SiC crystals
British Library Online Contents | 2001
|Engineering Index Backfile | 1941
|MicroRaman study of the effect of oxide layer on nitriding of Ti-6Al-4V
British Library Online Contents | 2008
|MicroRaman and Photorefractivity Study of Hafnium-Doped Lithium Niobate Crystals
British Library Online Contents | 2006
|MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC
British Library Online Contents | 2000
|