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    High Resolution MicroRaman Study of Blisters in Cr~2O~3 Thermal Oxide Films

    New search for: Kemdehoundja, M.
    New search for: Dinhut, J.F.
    New search for: Bonnet, G.
    New search for: Steinmetz, P.
    New search for: Wright, I.G.
    New search for: Galerie, A.
    New search for: Monceau, D.
    New search for: Mathieu, S.

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    High Resolution MicroRaman Study of Blisters in Cr~2O~3 Thermal Oxide Films

    New search for: Kemdehoundja, M.
    New search for: Dinhut, J.F.
    New search for: Bonnet, G.
    New search for: Steinmetz, P.
    New search for: Wright, I.G.
    New search for: Galerie, A.
    New search for: Monceau, D.
    New search for: Mathieu, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    High Resolution MicroRaman Study of Blisters in Cr~2O~3 Thermal Oxide Films

    New search for: Kemdehoundja, M.
    New search for: Dinhut, J.F.
    New search for: Bonnet, G.
    New search for: Steinmetz, P.
    New search for: Wright, I.G.
    New search for: Galerie, A.
    New search for: Monceau, D.
    New search for: Mathieu, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    High Resolution MicroRaman Study of Blisters in Cr~2O~3 Thermal Oxide Films

    Contributors:

    Kemdehoundja, M. (author) / Grosseau-Poussard, J.L. (author) / Dinhut, J.F. (author) / Bonnet, G. (author) / Steinmetz, P. / Wright, I.G. / Galerie, A. / Monceau, D. / Mathieu, S.

    Published in:

    High Temperature Corrosion and Protection of Materials 7 - PART 2 ; 889-896

    MATERIALS SCIENCE FORUM ; 595/598

    Publication date:

    2008-01-01

    Size:

    8 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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