Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Electrical characterization of high-k gate dielectrics on semiconductors
Ma, T. P. (Autor:in)
APPLIED SURFACE SCIENCE ; 255 ; 672-675
01.01.2008
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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