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SIMS depth profiles of alloying elements in surface layers formed in Cu-based alloys during annealing
SIMS depth profiles of alloying elements in surface layers formed in Cu-based alloys during annealing
SIMS depth profiles of alloying elements in surface layers formed in Cu-based alloys during annealing
Suzuki, S. (Autor:in) / Shibata, H. (Autor:in) / Ito, M. (Autor:in) / Kimura, T. (Autor:in)
APPLIED SURFACE SCIENCE ; 255 ; 1327-1330
01.01.2008
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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