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SIMS depth profiles of alloying elements in surface layers formed in Cu-based alloys during annealing
SIMS depth profiles of alloying elements in surface layers formed in Cu-based alloys during annealing
SIMS depth profiles of alloying elements in surface layers formed in Cu-based alloys during annealing
Suzuki, S. (author) / Shibata, H. (author) / Ito, M. (author) / Kimura, T. (author)
APPLIED SURFACE SCIENCE ; 255 ; 1327-1330
2008-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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