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SIMS characterization of segregation in InAs/GaAs heterostructures
SIMS characterization of segregation in InAs/GaAs heterostructures
SIMS characterization of segregation in InAs/GaAs heterostructures
Gallardo, S. (Autor:in) / Kudriatsev, Y. (Autor:in) / Villegas, A. (Autor:in) / Ramirez, G. (Autor:in) / Asomoza, R. (Autor:in) / Cruz-Hernandez, E. (Autor:in) / Rojas-Ramirez, J. S. (Autor:in) / Lopez-Lopez, M. (Autor:in)
APPLIED SURFACE SCIENCE ; 255 ; 1341-1344
01.01.2008
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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