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High-resolution electron holography for the study of composition and strain in thin film semiconductors
High-resolution electron holography for the study of composition and strain in thin film semiconductors
High-resolution electron holography for the study of composition and strain in thin film semiconductors
Houdellier, F. (Autor:in) / Hytch, M. J. (Autor:in) / Snoeck, E. (Autor:in) / Casanove, M. J. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 135 ; 188-191
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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