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Contact-Less Electrical Defect Characterization of Semi-Insulating 6H-SiC Bulk Material
Contact-Less Electrical Defect Characterization of Semi-Insulating 6H-SiC Bulk Material
Contact-Less Electrical Defect Characterization of Semi-Insulating 6H-SiC Bulk Material
Hahn, S. (Autor:in) / Beyer, F.C. (Autor:in) / Gallstrom, A. (Autor:in) / Carlsson, P. (Autor:in) / Henry, A. (Autor:in) / Magnusson, B. (Autor:in) / Niklas, J.R. (Autor:in) / Janzen, E. (Autor:in)
MATERIALS SCIENCE FORUM ; 600/603 ; 405-408
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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