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    Contact-Less Electrical Defect Characterization of Semi-Insulating 6H-SiC Bulk Material

    New search for: Hahn, S.
    New search for: Beyer, F.C.
    New search for: Gallstrom, A.
    New search for: Carlsson, P.
    New search for: Henry, A.
    New search for: Magnusson, B.
    New search for: Niklas, J.R.
    New search for: Janzen, E.

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    Contact-Less Electrical Defect Characterization of Semi-Insulating 6H-SiC Bulk Material

    New search for: Hahn, S.
    New search for: Beyer, F.C.
    New search for: Gallstrom, A.
    New search for: Carlsson, P.
    New search for: Henry, A.
    New search for: Magnusson, B.
    New search for: Niklas, J.R.
    New search for: Janzen, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Contact-Less Electrical Defect Characterization of Semi-Insulating 6H-SiC Bulk Material

    New search for: Hahn, S.
    New search for: Beyer, F.C.
    New search for: Gallstrom, A.
    New search for: Carlsson, P.
    New search for: Henry, A.
    New search for: Magnusson, B.
    New search for: Niklas, J.R.
    New search for: Janzen, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Contact-Less Electrical Defect Characterization of Semi-Insulating 6H-SiC Bulk Material

    Contributors:

    Hahn, S. (author) / Beyer, F.C. (author) / Gallstrom, A. (author) / Carlsson, P. (author) / Henry, A. (author) / Magnusson, B. (author) / Niklas, J.R. (author) / Janzen, E. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 600/603 ; 405-408

    Publication date:

    2009-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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