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Investigation of thin TiO2 films cosputtered with Si species
Investigation of thin TiO2 films cosputtered with Si species
Investigation of thin TiO2 films cosputtered with Si species
Hsu, J. C. (Autor:in) / Lee, C. C. (Autor:in) / Chen, H. L. (Autor:in) / Kuo, C. C. (Autor:in) / Wang, P. W. (Autor:in)
APPLIED SURFACE SCIENCE ; 255 ; 4852-4858
01.01.2009
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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