Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
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Stoichiometry and microstructural effects on electrical conduction in pulsed dc sputtered vanadium oxide thin films
Stoichiometry and microstructural effects on electrical conduction in pulsed dc sputtered vanadium oxide thin films
Stoichiometry and microstructural effects on electrical conduction in pulsed dc sputtered vanadium oxide thin films
Gauntt, B.D. (Autor:in) / Dickey, E.C. (Autor:in) / Horn, M.W. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 24 ; 1590-1599
01.01.2009
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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