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Two Dimensional X-Ray Diffraction Mapping of Basal Plane Orientation on SiC Substrates
Two Dimensional X-Ray Diffraction Mapping of Basal Plane Orientation on SiC Substrates
Two Dimensional X-Ray Diffraction Mapping of Basal Plane Orientation on SiC Substrates
Palisaitis, J. (Autor:in) / Bergman, J.P. (Autor:in) / Persson, P.O.A. (Autor:in)
MATERIALS SCIENCE FORUM ; 615/617 ; 275-278
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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