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Effects of electron and proton irradiation on embedded SiGe source/drain diodes
Effects of electron and proton irradiation on embedded SiGe source/drain diodes
Effects of electron and proton irradiation on embedded SiGe source/drain diodes
Ohyama, H. (Autor:in) / Nagano, T. (Autor:in) / Takakura, K. (Autor:in) / Motoki, M. (Autor:in) / Matsuo, K. (Autor:in) / Nakamura, H. (Autor:in) / Sawada, M. (Autor:in) / Midorikawa (Autor:in) / Kuboyama, S. (Autor:in) / Gonzalez, M.B. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 11 ; 310-313
01.01.2008
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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