Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Characterization of Si-added aluminum oxide (AlSiO) films for power devices
Characterization of Si-added aluminum oxide (AlSiO) films for power devices
Characterization of Si-added aluminum oxide (AlSiO) films for power devices
Komatsu, N. (Autor:in) / Masumoto, K. (Autor:in) / Aoki, H. (Autor:in) / Kimura, C. (Autor:in) / Sugino, T. (Autor:in)
APPLIED SURFACE SCIENCE ; 256 ; 1803-1806
01.01.2010
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
CeMn/AlSiO ceramic layers on metallic supports for high-temperature catalytic processes
British Library Online Contents | 2003
|Effect of nitrogen doping on the properties of AlSiO film for wide bandgap semiconductors
British Library Online Contents | 2010
|Preparation and characterization of aluminum-incorporated cadmium oxide films
British Library Online Contents | 2010
|British Library Online Contents | 1993
|Preparation and Characterization of Phosphorus-Doped Aluminum Oxide Thin Films
British Library Online Contents | 1998
|