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Temperature Dependence of the Carrier Lifetime in 4H-SiC Epilayers
Temperature Dependence of the Carrier Lifetime in 4H-SiC Epilayers
Temperature Dependence of the Carrier Lifetime in 4H-SiC Epilayers
Klein, P.B. (Autor:in) / Myers-Ward, R.L. (Autor:in) / Lew, K.K. (Autor:in) / VanMil, B.L. (Autor:in) / Eddy, C.R. (Autor:in) / Gaskill, D.K. (Autor:in) / Shrivastava, A. (Autor:in) / Sudarshan, T.S. (Autor:in) / Bauer, A.J. / Friedrichs, P.
01.01.2010
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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