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A C-V Method of Slow-Switching Interface Traps Identification in Silicon Carbide MOS Structures
A C-V Method of Slow-Switching Interface Traps Identification in Silicon Carbide MOS Structures
A C-V Method of Slow-Switching Interface Traps Identification in Silicon Carbide MOS Structures
Gutt, T. (Autor:in) / Przewlocki, H.M. (Autor:in) / Bakowski, M. (Autor:in) / Bauer, A.J. / Friedrichs, P. / Krieger, M. / Pensl, G. / Rupp, R. / Seyller, T.
01.01.2010
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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