Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    A C-V Method of Slow-Switching Interface Traps Identification in Silicon Carbide MOS Structures

    New search for: Gutt, T.
    New search for: Przewlocki, H.M.
    New search for: Bakowski, M.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    A C-V Method of Slow-Switching Interface Traps Identification in Silicon Carbide MOS Structures

    New search for: Gutt, T.
    New search for: Przewlocki, H.M.
    New search for: Bakowski, M.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A C-V Method of Slow-Switching Interface Traps Identification in Silicon Carbide MOS Structures

    New search for: Gutt, T.
    New search for: Przewlocki, H.M.
    New search for: Bakowski, M.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    A C-V Method of Slow-Switching Interface Traps Identification in Silicon Carbide MOS Structures

    Contributors:

    Gutt, T. (author) / Przewlocki, H.M. (author) / Bakowski, M. (author) / Bauer, A.J. / Friedrichs, P. / Krieger, M. / Pensl, G. / Rupp, R. / Seyller, T.

    Published in:

    Silicon Carbide and Related Materials 2009 ; 523-526

    MATERIALS SCIENCE FORUM ; 645/648

    Publication date:

    2010-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Shallow traps and positron dynamics in epitaxial silicon carbide

    Britton, D. T. / Barthe, M. F. / Corbel, C. et al. | British Library Online Contents | 2002

    Interface Passivation for Silicon Dioxide Layers on Silicon Carbide

    Dhar, S. / Wang, S. / Williams, J. R. et al. | British Library Online Contents | 2005

    Fast and slow interface traps in transparent NiO gated AlGaN/GaN heterostructure field-effect transistors

    Li, Liuan / Chen, Jia / Liu, Zhenxing et al. | British Library Online Contents | 2019

    3D Printing of Silicon Carbide Structures

    GOODMAN WILLIAM A | European Patent Office | 2019

    Free access

    Graphene-on-Porous-Silicon Carbide Structures

    Mynbaeva, M.G. / Sitnikova, A.A. / Lebedev, S.P. et al. | British Library Online Contents | 2013

    Back to top