Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency: Fid-Bau Portal

Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency

Iwamoto, N. / Koizumi, A. / Onoda, S. / Makino, T. / Ohshima, T. / Kojima, K. / Koike, S. / Uchida, K. / Nozaki, S.

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Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency

Iwamoto, N. / Koizumi, A. / Onoda, S. / Makino, T. / Ohshima, T. / Kojima, K. / Koike, S. / Uchida, K. / Nozaki, S.

Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency

Iwamoto, N. / Koizumi, A. / Onoda, S. / Makino, T. / Ohshima, T. / Kojima, K. / Koike, S. / Uchida, K. / Nozaki, S.

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Titel:

Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency

Beteiligte:

Iwamoto, N. (Autor:in) / Koizumi, A. (Autor:in) / Onoda, S. (Autor:in) / Makino, T. (Autor:in) / Ohshima, T. (Autor:in) / Kojima, K. (Autor:in) / Koike, S. (Autor:in) / Uchida, K. (Autor:in) / Nozaki, S. (Autor:in)

Erschienen in:

MATERIALS SCIENCE FORUM ; 717/720 ; 267-270

Erscheinungsdatum:

01.01.2012

Format / Umfang:

4 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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