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    Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency

    New search for: Iwamoto, N.
    New search for: Koizumi, A.
    New search for: Onoda, S.
    New search for: Makino, T.
    New search for: Ohshima, T.
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    Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency

    New search for: Iwamoto, N.
    New search for: Koizumi, A.
    New search for: Onoda, S.
    New search for: Makino, T.
    New search for: Ohshima, T.
    New search for: Kojima, K.
    New search for: Koike, S.
    New search for: Uchida, K.
    New search for: Nozaki, S.

    Access

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    Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency

    New search for: Iwamoto, N.
    New search for: Koizumi, A.
    New search for: Onoda, S.
    New search for: Makino, T.
    New search for: Ohshima, T.
    New search for: Kojima, K.
    New search for: Koike, S.
    New search for: Uchida, K.
    New search for: Nozaki, S.

    Access

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    Title:

    Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency

    Contributors:

    Iwamoto, N. (author) / Koizumi, A. (author) / Onoda, S. (author) / Makino, T. (author) / Ohshima, T. (author) / Kojima, K. (author) / Koike, S. (author) / Uchida, K. (author) / Nozaki, S. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 717/720 ; 267-270

    Publication date:

    2012-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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