Evaluation of Long Carrier Lifetimes in Very Thick 4H-SiC Epilayers

Miyazawa, T. / Ito, M. / Tsuchida, H. | British Library Online Contents | 2011

Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers

Huh, S. W. / Sumakeris, J. J. / Polyakov, A. Y. et al. | British Library Online Contents | 2006

Variations in the Measured Carrier Lifetimes of n^- 4H-SiC Epilayers

Klein, P.B. / Caldwell, J.D. / Shrivastava, A. et al. | British Library Online Contents | 2009

Temperature and Injection Level Dependencies of Carrier Lifetimes in p-Type and n-Type 4H-SiC Epilayers

Hayashi, T. / Asano, K. / Suda, J. et al. | British Library Online Contents | 2010

Impact of Carrier Lifetimes on Non-Destructive Mapping of Dislocations in 4H-SiC Epilayers

Feng, G. / Suda, J. / Kimoto, T. | British Library Online Contents | 2011