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Physical/chemical properties of tin oxide thin film transistors prepared using plasma-enhanced atomic layer deposition
Physical/chemical properties of tin oxide thin film transistors prepared using plasma-enhanced atomic layer deposition
Physical/chemical properties of tin oxide thin film transistors prepared using plasma-enhanced atomic layer deposition
Lee, B.K. (Autor:in) / Jung, E. (Autor:in) / Kim, S.H. (Autor:in) / Moon, D.C. (Autor:in) / Lee, S.S. (Autor:in) / Park, B.K. (Autor:in) / Hwang, J.H. (Autor:in) / Chung, T.-M. (Autor:in) / Kim, C.G. (Autor:in) / An, K.-S. (Autor:in)
01.01.2012
4 pages
Aufsatz (Zeitschrift)
Englisch
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