Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry
Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry
Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry
Bhattacharya, D. (Autor:in) / Basu, S. (Autor:in) / Singh, S. (Autor:in) / Roy, S. (Autor:in) / Dev, B. N. (Autor:in)
APPLIED SURFACE SCIENCE ; 263 ; 666-670
01.01.2012
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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