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    Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry

    New search for: Bhattacharya, D.
    New search for: Basu, S.
    New search for: Singh, S.
    New search for: Roy, S.
    New search for: Dev, B. N.

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    Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry

    New search for: Bhattacharya, D.
    New search for: Basu, S.
    New search for: Singh, S.
    New search for: Roy, S.
    New search for: Dev, B. N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry

    New search for: Bhattacharya, D.
    New search for: Basu, S.
    New search for: Singh, S.
    New search for: Roy, S.
    New search for: Dev, B. N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry

    Contributors:

    Bhattacharya, D. (author) / Basu, S. (author) / Singh, S. (author) / Roy, S. (author) / Dev, B. N. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 263 ; 666-670

    Publication date:

    2012-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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