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Lattice resolved annular dark-field scanning transmission electron microscopy of (Al, In)GaN/GaN layers for measuring segregation with sub-monolayer precision
Lattice resolved annular dark-field scanning transmission electron microscopy of (Al, In)GaN/GaN layers for measuring segregation with sub-monolayer precision
Lattice resolved annular dark-field scanning transmission electron microscopy of (Al, In)GaN/GaN layers for measuring segregation with sub-monolayer precision
Walther, T. (Autor:in) / Amari, H. (Autor:in) / Ross, I. M. (Autor:in) / Wang, T. (Autor:in) / Cullis, A. G. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 48 ; 2883-2892
01.01.2013
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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A New Approach for Electron Tomography: Annular Dark-Field Transmission Electron Microscopy
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