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    Lattice resolved annular dark-field scanning transmission electron microscopy of (Al, In)GaN/GaN layers for measuring segregation with sub-monolayer precision

    New search for: Walther, T.
    New search for: Amari, H.
    New search for: Ross, I. M.
    New search for: Wang, T.
    New search for: Cullis, A. G.

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    Lattice resolved annular dark-field scanning transmission electron microscopy of (Al, In)GaN/GaN layers for measuring segregation with sub-monolayer precision

    New search for: Walther, T.
    New search for: Amari, H.
    New search for: Ross, I. M.
    New search for: Wang, T.
    New search for: Cullis, A. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Lattice resolved annular dark-field scanning transmission electron microscopy of (Al, In)GaN/GaN layers for measuring segregation with sub-monolayer precision

    New search for: Walther, T.
    New search for: Amari, H.
    New search for: Ross, I. M.
    New search for: Wang, T.
    New search for: Cullis, A. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Lattice resolved annular dark-field scanning transmission electron microscopy of (Al, In)GaN/GaN layers for measuring segregation with sub-monolayer precision

    Contributors:

    Walther, T. (author) / Amari, H. (author) / Ross, I. M. (author) / Wang, T. (author) / Cullis, A. G. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 48 ; 2883-2892

    Publication date:

    2013-01-01

    Size:

    10 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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