Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets: Fid-Bau Portal

Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets

Uhnevionak, V. / Strenger, C. / Burenkov, A. / Mortet, V. / Bedel-Pereira, E. / Cristiano, F. / Bauer, A. / Pichler, P.

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Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets

Uhnevionak, V. / Strenger, C. / Burenkov, A. / Mortet, V. / Bedel-Pereira, E. / Cristiano, F. / Bauer, A. / Pichler, P.

Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets

Uhnevionak, V. / Strenger, C. / Burenkov, A. / Mortet, V. / Bedel-Pereira, E. / Cristiano, F. / Bauer, A. / Pichler, P.

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Titel:

Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets

Beteiligte:

Uhnevionak, V. (Autor:in) / Strenger, C. (Autor:in) / Burenkov, A. (Autor:in) / Mortet, V. (Autor:in) / Bedel-Pereira, E. (Autor:in) / Cristiano, F. (Autor:in) / Bauer, A. (Autor:in) / Pichler, P. (Autor:in) / Lebedev, A.A. / Davydov, S.Y.

Erschienen in:

Silicon Carbide and Related Materials 2012 Selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6, 2012, St. Petersburg, Russian Federation ; 533-536

MATERIALS SCIENCE FORUM ; 740/742

Erscheinungsdatum:

01.01.2013

Format / Umfang:

4 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

Suzuki, S. / Harada, S. / Kosugi, R. et al. | British Library Online Contents | 2002

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Hishiki, S. / Reshanov, S.A. / Ohshima, T. et al. | British Library Online Contents | 2009

Effect of Band-Edge Interface Traps and Transition Region Mobility on Transport in 4H-SiC MOSFETs

Potbhare, S. / Akturk, A. / Goldsman, N. et al. | British Library Online Contents | 2010

Interface Trap Profiles near the Band Edges in 6H-SiC MOSFETs

Saks, N. S. / Mani, S. S. / Agarwal, A. K. | British Library Online Contents | 2000

Channel Doped SiC-MOSFETs

Ogino, S. / Oikawa, T. / Ueno, K. | British Library Online Contents | 2000

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