Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets: Fid-Bau Portal

Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets

Uhnevionak, V. / Strenger, C. / Burenkov, A. / Mortet, V. / Bedel-Pereira, E. / Cristiano, F. / Bauer, A. / Pichler, P.

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Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets

Uhnevionak, V. / Strenger, C. / Burenkov, A. / Mortet, V. / Bedel-Pereira, E. / Cristiano, F. / Bauer, A. / Pichler, P.

Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets

Uhnevionak, V. / Strenger, C. / Burenkov, A. / Mortet, V. / Bedel-Pereira, E. / Cristiano, F. / Bauer, A. / Pichler, P.

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Title:

Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets

Contributors:

Uhnevionak, V. (author) / Strenger, C. (author) / Burenkov, A. (author) / Mortet, V. (author) / Bedel-Pereira, E. (author) / Cristiano, F. (author) / Bauer, A. (author) / Pichler, P. (author) / Lebedev, A.A. / Davydov, S.Y.

Published in:

Silicon Carbide and Related Materials 2012 Selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6, 2012, St. Petersburg, Russian Federation ; 533-536

MATERIALS SCIENCE FORUM ; 740/742

Publication date:

2013-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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