Sodium Enhanced Oxidation: Absence of Shallow Interface Traps after Removal of Sodium Ions from the SiO~2/4H-SiC Interface: Fid-Bau Portal

Sodium Enhanced Oxidation: Absence of Shallow Interface Traps after Removal of Sodium Ions from the SiO~2/4H-SiC Interface

Hermannsson, P.G. / Allerstam, F. / Hauksson, S. / Sveinbjornsson, E.O.

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Sodium Enhanced Oxidation: Absence of Shallow Interface Traps after Removal of Sodium Ions from the SiO~2/4H-SiC Interface

Hermannsson, P.G. / Allerstam, F. / Hauksson, S. / Sveinbjornsson, E.O.

Sodium Enhanced Oxidation: Absence of Shallow Interface Traps after Removal of Sodium Ions from the SiO~2/4H-SiC Interface

Hermannsson, P.G. / Allerstam, F. / Hauksson, S. / Sveinbjornsson, E.O.

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Titel:

Sodium Enhanced Oxidation: Absence of Shallow Interface Traps after Removal of Sodium Ions from the SiO~2/4H-SiC Interface

Beteiligte:

Hermannsson, P.G. (Autor:in) / Allerstam, F. (Autor:in) / Hauksson, S. (Autor:in) / Sveinbjornsson, E.O. (Autor:in) / Lebedev, A.A. / Davydov, S.Y. / Ivanov, P.A. / Levinshtein, M.E.

Erschienen in:

Silicon Carbide and Related Materials 2012 Selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6, 2012, St. Petersburg, Russian Federation ; 749-752

MATERIALS SCIENCE FORUM ; 740/742

Erscheinungsdatum:

01.01.2013

Format / Umfang:

4 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

Sveinbjornsson, E. O. / Allerstam, F. / Olafsson, H. O. et al. | British Library Online Contents | 2007

Formation of Deep Traps at the 4H-SiC/SiO~2 Interface when Utilizing Sodium Enhanced Oxidation

Allerstam, F. / Gudjonsson, G. / Sveinbjornsson, E. O. et al. | British Library Online Contents | 2007

The Sodium-Aluminium Interface

Horsewell, A. / Johnson, E. / Bourdelle, K. K. | British Library Online Contents | 1993

Shallow Traps at P-Doped SiO~2/4H-SiC(0001) Interface

Okamoto, D. / Yano, H. / Kotake, S. et al. | British Library Online Contents | 2011

A Study of the Shallow Electron Traps at the 4H-SiC/SiO~2 Interface

Olafsson, H. O. / Sveinbjornsson, E. O. / Rudenko, T. E. et al. | British Library Online Contents | 2003

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