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Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy
Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy
Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy
Gracin, D. (Autor:in) / Siketic, Z. (Autor:in) / Juraic, K. (Autor:in) / Ceh, M. (Autor:in)
APPLIED SURFACE SCIENCE ; 275 ; 19-22
01.01.2013
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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