Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy: Fid-Bau Portal

Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy

Gracin, D. / Siketic, Z. / Juraic, K. / Ceh, M.

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Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy

Gracin, D. / Siketic, Z. / Juraic, K. / Ceh, M.

Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy

Gracin, D. / Siketic, Z. / Juraic, K. / Ceh, M.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy

Contributors:

Gracin, D. (author) / Siketic, Z. (author) / Juraic, K. (author) / Ceh, M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 275 ; 19-22

Publication date:

2013-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Zheng, J. G. / Pan, X. / Schweizer, M. et al. | British Library Online Contents | 1996

Elastic recoil detection analysis of hydrogen in high strength steel

Kimura, A. / Nakatani, Y. / Yamada, K. et al. | British Library Online Contents | 2000

Hydrogenated amorphous/nanocrystalline silicon thin films on porous anodic alumina substrate

Kim, S.-O. / Khodin, A. / Lee, J.K. | British Library Online Contents | 2010

Heavy Ion Recoil Time of Flight Method for Materials Analysis

Cohen, D. / Dytlewski, N. / Martin, J. et al. | British Library Online Contents | 1997

Time-resolved high-resolution transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy of metal-mediated crystallization of amorphous germanium films

Tanaka, N. / Kawahara, M. | British Library Online Contents | 2001